Reliability growth models for hardware and software systems based on nonhomogeneous Poisson processes: a survey : Shigeru Yamada and Shunji Osaka. Microelectron. Reliab.23 (1), 91 (1983)

• Book ID: 107829490
• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 126 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)90779-5