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Reliability evaluation for Blu-Ray laser diodes

✍ Scribed by Matteo Meneghini; Nicola Trivellin; Kenji Orita; Masaaki Yuri; Tsuyoshi Tanaka; Daisuke Ueda; Enrico Zanoni; Gaudenzio Meneghesso

No coin nor oath required. For personal study only.

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