Reliability evaluation and prediction for silicon photodetectors : E. A. Weis, D. Caldararu, M. M. Snyder and N. Croitoru. IEEE Trans. Reliab. 37, 14 (1988)

• Book ID: 103285687
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 133 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90203-5