✦ LIBER ✦
Reliability evaluation and failure analysis for multilayer ceramic chip capacitors : Toshio Kobayashi, Hisashi Ariyoshi and Akihiko Masuda. IEEE Trans. Components, Hybrids, Mfg Technol. Chmt-1, (3) p. 316 (September 1978)
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 90 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0026-2714
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