Reliability engineering: theory and practice

✍ Scribed by Birolini A

• Publisher: Springer
• Year: 2017
• Tongue: English
• Leaves: 666
• Edition: 8
• Category: Library

✦ Table of Contents

Preface to the 8 th Edition......Page 6
Contents......Page 9
1.1 Introduction......Page 16
1.2.1 Reliability......Page 17
1.2.2 Failure......Page 18
1.2.3 Failure Rate, MTTF, MTBF......Page 19
1.2.5 Logistic Support......Page 23
1.2.7 Safety, Risk, Risk Acceptance......Page 24
1.2.9 Cost and System Effectiveness......Page 26
1.2.10 Product Liability......Page 30
1.2.11 Historical Development......Page 31
1.3.1 Quality and Reliability (RAMS) Assurance Tasks......Page 32
1.3.2 Basic Quality and Reliability (RAMS) Assurance Rules......Page 34
1.3.3 Elements of a Quality Assurance System......Page 36
1.3.4 Motivation and Training......Page 39
2.1 Introduction......Page 40
2.2.2 Reliability Block Diagram......Page 43
2.2.3 Operating Conditions at Component Level, Stress Factors......Page 48
2.2.4 Failure Rate of Electronic Components......Page 50
2.2.5 Reliability of One-Item Structures......Page 54
2.2.6.1 Systems without Redundancy (series models)......Page 56
2.2.6.2 Concept of Redundancy......Page 57
2.2.6.3 Parallel Models......Page 58
2.2.6.4 Series Parallel Structures with Independent Elements......Page 60
2.2.6.5 Majority Redundancy......Page 64
2.2.7 Part Count Method......Page 66
2.3.1 Key Item Method......Page 67
2.3.1.1 Bridge Structure......Page 68
2.3.1.2 Reliability Block Diagram in Which at Least One Element Appears More than Once......Page 69
2.3.2 Successful Path Method......Page 70
2.3.3 State Space Method......Page 71
2.3.4 Boolean Function Method......Page 72
2.3.5 Parallel Models with Const. Failure Rates & Load Sharing......Page 76
2.3.6 Elements with more than one Failure Mechanism or one Failure Mode......Page 79
2.3.7 Basic Considerations on Fault Tolerant Structures......Page 81
2.4 Reliability Allocation and Optimization......Page 82
2.5 Mechanical Reliability, Drift Failures......Page 83
2.6 Failure Modes Analyses......Page 87
2.7 Reliability Aspects in Design Reviews......Page 92
3.1 Basic Selection Criteria for Electronic Components......Page 96
3.1.1 Environment......Page 97
3.1.3 Technology......Page 99
3.1.6 Reliability......Page 101
3.2 Qualification Tests for Complex Electronic Components......Page 102
3.2.1 Electrical Test of Complex ICs......Page 103
3.2.2 Characterization of Complex ICs......Page 105
3.2.3 Environmental and Special Tests of Complex ICs......Page 107
3.3.1 Failure Modes of Electronic Components......Page 116
3.3.3 Failure Analysis of Electronic Components......Page 117
3.3.4 Present VLSI Production-Related Reliability Problems......Page 121
3.4 Qualification Tests for Electronic Assemblies......Page 123
4.1 Maintenance, Maintainability......Page 127
4.2 Maintenance Concept......Page 130
4.2.2 Fault Detection (Recognition) and Localization......Page 131
4.2.3 User Documentation......Page 133
4.2.5 User Logistic Support......Page 134
4.4.1 Calculation of MTTRS & MDTS......Page 136
4.5.1 Centralized Logistic Support, Nonrepairable Spare Parts......Page 140
4.5.2 Decentralized Logistic Support, Nonrepairable Spare Parts......Page 144
4.5.3 Repairable Spare Parts......Page 145
4.6.1 Complete renewal at each maintenance action......Page 149
4.6.2 Block replacement with minimal repair at failure......Page 153
4.6.3 Further considerations on maintenance strategies......Page 154
4.7 Basic Cost Considerations......Page 157
5.1.1 Derating......Page 159
5.1.2 Cooling......Page 160
5.1.3 Moisture......Page 162
5.1.4 Electromagnetic Compatibility, ESD Protection......Page 163
5.1.5.2 Component Use......Page 165
5.1.5.3 PCB and Assembly Design......Page 166
5.1.5.4 PCB and Assembly Manufacturing......Page 167
5.1.6 Particular Guidelines for IC Design and Manufacturing......Page 168
5.2.1 General Guidelines......Page 169
5.2.2 Testability......Page 170
5.2.3 Connections, Accessibility, Exchangeability......Page 172
5.2.5 Human, Ergonomic, and Safety Aspects......Page 173
5.3 Design Guidelines for Software Quality......Page 174
5.3.1 Guidelines for Software Defect Prevention......Page 177
5.3.2 Configuration Management......Page 180
5.3.4 Software Quality Growth Models......Page 181
6.1 Introduction, General Assumptions, Conclusions......Page 184
6.2 One-Item Structure......Page 190
6.2.1.1 Reliability Function......Page 191
6.2.1.2 Point Availability......Page 192
6.2.1.3 Average Availability......Page 193
6.2.1.4 Interval Reliability......Page 194
6.2.1.5 Special Kinds of Availability......Page 195
6.2.2 One-Item Structure New at t=0 with Const. Failure Rate λ......Page 198
6.2.3 One-Item Structure with Arbitrary Conditions at t=0......Page 199
6.2.4 Asymptotic Behavior......Page 200
6.2.5 Steady-State Behavior......Page 202
6.3.1 Series Structure with Constant Failure and Repair Rates......Page 204
6.3.2 Series Structure with Constant Failure and Arbitrary Repair Rates......Page 207
6.3.3 Series Structure with Arbitrary Failure & Repair Rates......Page 208
6.4.1 1-out-of-2 Redundancy with Const. Failure & Repair Rates......Page 211
6.4.2 1-out-of-2 Redundancy with Constant Failure and Arbitrary Repair Rates......Page 219
6.4.3 1-out-of-2 Redundancy with Constant Failure Rate only in the Reserve State, Arbitrary Repair Rates......Page 222
6.5 k-out-of-n Redundancy (Warm, Identical Elements, one Repair Crew)......Page 228
6.5.1 k-out-of-n Redundancy with Const. Failure & Repair Rates......Page 229
6.5.2 k-out-of-n Redundancy with Constant Failure and Arbitrary Repair Rates......Page 233
6.6 Simple Series Parallel Structures (one Repair Crew)......Page 235
6.7.1 Introduction......Page 241
6.7.2 Application to a Practical Example......Page 245
6.8.1 General Considerations......Page 253
6.8.2 Preventive Maintenance......Page 255
6.8.3 Imperfect Switching......Page 258
6.8.4 Incomplete Coverage......Page 264
6.8.5 Elements with more than two States or one Failure Mode......Page 272
6.8.6.2 Time Censored Reconfiguration (Phased-Mission Systems)......Page 274
6.8.6.3 Failure Censored Reconfiguration......Page 281
6.8.6.4 Reward and Frequency / Duration Aspects......Page 285
6.8.7 Systems with Common Cause Failures......Page 286
6.8.8 Basic Considerations on Network Reliability......Page 290
6.8.9 General Procedure for Modeling Complex Systems......Page 292
6.9.2 Static and Dynamic Fault Trees......Page 295
6.9.3 Binary Decision Diagrams......Page 298
6.9.4 Event Trees......Page 301
6.9.5 Petri Nets......Page 302
6.9.6.1 Numerical Computation of System's Reliability and Availability......Page 304
6.9.6.2 Monte Carlo Simulations......Page 305
6.9.7 Approximate Expressions for Large, Complex Systems......Page 308
6.10 Human Reliability......Page 309
6.11.1 Introduction......Page 314
6.11.2 Risk Modeling, MTTA, S (t)......Page 316
6.11.3 Risk Avoidance and Risk Mitigation......Page 324
7.1 Statistical Quality Control......Page 326
7.1.1 Estimation of a Defective Probability p......Page 327
7.1.2 Simple Two-sided Sampling Plans for the Demonstration of a Defective Probability p......Page 329
7.1.2.1 Simple Two-sided Sampling Plan......Page 330
7.1.2.2 Sequential Test......Page 332
7.1.3 One-sided Sampling Plans for the Demonstration of a Defective Probability p......Page 333
7.2.1 Reliability & Availability Estimation and Demonstration for the Case of a given (fixed) Mission......Page 336
7.2.2.1 Availability Estimation (Erlangian Failure-Free and / or Repair Times)......Page 338
7.2.2.2 Availability Demonstration (Erlangian Failure-Free and / or Repair Times)......Page 340
7.2.2.3 Further Availability Evaluation Methods for Continuous Operation......Page 341
7.2.3 Estimation & Demonstration of a Constant Failure Rate λ (or of MTBF for the Case MTBF ≡ 1/λ)......Page 343
7.2.3.1 Estimation of a Constant Failure Rate λ (or of MTBF for MTBF ≡ 1/λ)......Page 345
7.2.3.2 Simple Two-sided Test for the Demonstration of a Constant Failure Rate λ (or of MTBF for the case MTBF ≡ 1/λ)......Page 347
7.2.3.3 Simple One-sided Test for the Demonstration of a Constant Failure Rate λ (or of MTBF for the case MTBF ≡1/λ)......Page 351
7.3.1 Estimation of an MTTR......Page 352
7.3.2 Demonstration of an MTTR......Page 354
7.4 Accelerated Testing......Page 356
7.5.1 Kolmogorov-Smirnov Test......Page 361
7.5.2 Chi-square Test......Page 365
7.6.1 General considerations......Page 368
7.6.2 Tests for Nonhomogeneous Poisson Processes......Page 370
7.6.3.1 Tests of an HPP versus an NHPP with increasing intensity......Page 372
7.6.3.2 Tests of an HPP versus an NHPP with decreasing intensity......Page 375
7.6.3.3 Heuristic Tests to distinguish between HPP and General Monotonic Trend......Page 376
7.7 Reliability Growth......Page 378
8.1 Basic Activities......Page 384
8.2.1 Testing of Electronic Components......Page 385
8.2.2 Screening of Electronic Components......Page 386
8.3 Testing and Screening of Electronic Assemblies......Page 389
8.4.1 Basic Considerations......Page 391
8.4.2 Quality Cost Optimization at Incoming Inspection Level......Page 394
8.4.3 Procedure to handle first deliveries......Page 399
A1 Terms and Definitions......Page 400
A2.1 Introduction......Page 416
A2.2 General Requirements in the Industrial Field......Page 417
A2.3 Requirements in the Aerospace, Railway, Defense, and Nuclear Fields......Page 419
A2.4 A Skillful , Allegorical Story of Reliability......Page 420
A3.1 Definition of Quality and Reliability (RAMS) Requirements......Page 422
A3.2 Realization of Quality & Reliability (RAMS) Requirements for Complex Equipment & Systems......Page 424
A3.3.1 Project Organization, Planning, and Scheduling......Page 429
A3.3.3 Reliability, Maintainability, and Safety Analyses......Page 430
A3.3.5 Software Quality Assurance......Page 431
A3.3.6 Configuration Management......Page 432
A3.3.7 Quality Tests......Page 433
A3.3.8 Quality Data Reporting System......Page 435
A4.1 System Design Review (Table A3.3, p. 419)......Page 436
A4.2 Preliminary Design Reviews (Table A3.3 on p. 419)......Page 437
A4.3 Critical Design Review (System Level, Table A3.3 on p. 419)......Page 440
A5 Requirements for a Quality Data Reporting System......Page 441
A6.1 Field of Events......Page 444
A6.2 Concept of Probability......Page 446
A6.3 Conditional Probability, Independence......Page 449
A6.4.1 Addition Theorem for Mutually Exclusive Events......Page 450
A6.4.2 Multiplication Theorem for Two Independent Events......Page 451
A6.4.4 Addition Theorem for Arbitrary Events......Page 452
A6.4.5 Theorem of Total Probability......Page 453
A6.5 Random Variables, Distribution Functions......Page 454
A6.6.1 Expected Value (Mean)......Page 460
A6.6.2 Variance......Page 463
A6.7 Multidimensional Random Variables, Conditional Distributions......Page 465
A6.8 Numerical Parameters of Random Vectors......Page 467
A6.8.1 Covariance Matrix, Correlation Coefficient......Page 468
A6.9 Distribution of the Sum of Independent Positive Random Variables and of tmin , tmax......Page 469
A6.10.1 Exponential Distribution......Page 472
A6.10.2 Weibull Distribution......Page 473
A6.10.3 Gamma Distribution, Erlangian Distribution, and Χ²-Distribution......Page 475
A6.10.4 Normal Distribution......Page 477
A6.10.5 Lognormal Distribution......Page 478
A6.10.7 Binomial Distribution......Page 480
A6.10.8 Poisson Distribution......Page 482
A6.10.9 Geometric Distribution......Page 484
A6.11 Limit Theorems......Page 485
A6.11.1 Laws of Large Numbers......Page 486
A6.11.2 Central Limit Theorem......Page 487
A7.1 Introduction......Page 491
A7.2 Renewal Processes......Page 494
A7.2.1 Renewal Function, Renewal Density......Page 496
A7.2.2 Recurrence Times......Page 499
A7.2.3 Asymptotic Behavior......Page 500
A7.2.4 Stationary Renewal Processes......Page 502
A7.2.5 Homogeneous Poisson Processes (HPP)......Page 503
A7.3 Alternating Renewal Processes......Page 505
A7.4 Regenerative Processes with a Finite Number of States......Page 509
A7.5.1 Markov Chains with a Finite Number of States......Page 511
A7.5.2 Markov Processes with a Finite Number of States......Page 513
A7.5.3.1 Method of Differential Equations......Page 522
A7.5.3.2 Method of Integral Equations......Page 526
A7.5.3.3 Stationary State and Asymptotic Behavior......Page 527
A7.5.4.1 Frequency / Duration......Page 529
A7.5.4.2 Reward......Page 531
A7.5.5 Birth and Death Process......Page 532
A7.6 Semi-Markov Processes with a Finite Number of States......Page 536
A7.7 Semi-regenerative Processes with a Finite Number of States......Page 541
A7.8.1 General Considerations......Page 546
A7.8.2 Nonhomogeneous Poisson Processes (NHPP)......Page 547
A7.8.3 Superimposed Renewal Processes......Page 551
A7.8.4 Cumulative Processes......Page 552
A7.8.5 General Point Processes......Page 554
A8.1 Empirical Methods......Page 556
A8.1.1 Empirical Distribution Function......Page 557
A8.1.2 Empirical Moments and Quantiles......Page 559
A8.1.3 Further Applications of the Empirical Distribution Function......Page 560
A8.2.1 Point Estimation......Page 564
A8.2.2.1 Estimation of an Unknown Probability p......Page 569
A8.2.2.2 Estimation of the Parameter λ for an Exponential Distribution: Fixed Test Duration (Time Censoring), Instantaneous Replacement......Page 573
A8.2.2.3 Estimation of the Parameter λ for an Exponential Distribution: Fixed Number n of Failures (Failure Censoring), no Replacement......Page 574
A8.2.2.4 Availability Estimation (Erlangian Failure-Free and / or Repair Times)......Page 576
A8.3 Testing Statistical Hypotheses......Page 578
A8.3.1 Testing an Unknown Probability p......Page 579
A8.3.1.1 Simple Two-sided Sampling Plan......Page 580
A8.3.1.2 Sequential Test......Page 581
A8.3.1.3 Simple One-sided Sampling Plan......Page 582
A8.3.1.4 Availability Demonstration (Erlangian Failure-Free and/or Repair Times)......Page 584
A8.3.2 Goodness-of-fit Tests for Completely Specified F₀(t)......Page 586
A8.3.3 Goodness-of-fit Tests for a Distribution F₀(t) with Unknown Parameters......Page 589
A9.1 Standard Normal Distribution......Page 592
A9.2 Χ²-Distribution (Chi Square Distribution)......Page 593
A9.3 t-Distribution (Student Distribution)......Page 594
A9.4 F-Distribution (Fisher Distribution)......Page 595
A9.5 Table for the Kolmogorov Smirnov Test......Page 596
A9.6 Gamma Function......Page 597
A9.7 Laplace Transform......Page 598
A9.8.1 Lognormal Probability Chart......Page 600
A9.8.2 Weibull Probability Chart......Page 601
A9.8.3 Normal Probability Chart......Page 602
A10 Basic Technological Component's Properties......Page 603
A11 Problems for Homework......Page 607
Acronyms......Page 615
References......Page 616
Index......Page 642