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Reliability-constrained area optimization of VLSI power/ground networks via sequence of linear programmings

✍ Scribed by Tan, S.X.D.; Shi, C.J.R.; Jyh-Chwen Lee


Book ID
118698461
Publisher
IEEE
Year
2003
Tongue
English
Weight
394 KB
Volume
22
Category
Article
ISSN
0278-0070

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