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Reliability challenges in the nanoelectronics era

✍ Scribed by A.J. van Roosmalen; G.Q. Zhang

Book ID: 108210637
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 596 KB
Volume: 46
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2006.07.011

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