𝔖 Bobbio Scriptorium

✦ LIBER ✦

Reliability assurance and the growing complexity of electronic devices: R. Lombardini. Proc. CNET Conference on Reliability and Maintainability, Tregastel, France, p. 195 (8–12 September 1980)

Publisher: Elsevier Science
Year: 1981
Tongue: English
Weight: 91 KB
Volume: 21
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(81)90262-6

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