Reliability assessment of small signal GaAs FETS : Francois Behmann. Microelectron. Reliab.19, 107 (1979)

• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 122 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(79)90381-0