✦ LIBER ✦
Reliability assessment of SiO2/ZrO2 stack gate dielectric on strained-Si/Si0.8Ge0.2 heterolayers under dynamic and AC stress
✍ Scribed by M.K. Bera; C. Mahata; C.K. Maiti
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 733 KB
- Volume
- 11
- Category
- Article
- ISSN
- 1369-8001
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