Reliability assessment of fielded plastic and hermetically packaged microelectronics : Bruce Johnson and Vani Verma. IEEE Transactions on Reliability, 45 (1), 23 (1996)

• Book ID: 108362292
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 148 KB
• Volume: 37
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(97)87665-2