✦ LIBER ✦
Reliability assessment of CCDs operating under ionizing radiation ambients: Failure — Simulation studies via electrical overstressing
✍ Scribed by Samuel O. Agbo; Perambur S. Neelakanta; Lourdes M. Lay
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 558 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
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