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Reliability and validity of WAIS-R short forms in schizophrenia : Huegel, S. G., Allen, D. N., van Kammen, D. P., Kelley, M. E., & Gurklis Jr., J. A.


Book ID
117588989
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
173 KB
Volume
12
Category
Article
ISSN
0887-6177

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