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Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata

✍ Scribed by Mo Liu; Craig S. Lent

Book ID: 106384266
Publisher: Springer US
Year: 2007
Tongue: English
Weight: 583 KB
Volume: 23
Category: Article
ISSN: 0923-8174
DOI: 10.1007/s10836-006-0627-8

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