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Reliability analysis of warehouse containers under life test policies

โœ Scribed by Celestine A. Ntuen; Mohammed Chikha

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
220 KB
Volume
31
Category
Article
ISSN
0026-2714

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Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test
โœ N. Ronchi; F. Zanon; A. Stocco; A. Tazzoli; E. Zanoni; G. Meneghesso ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 790 KB

This paper report on the long-term stress (1000 h) carried out on AlGaN/GaN HEMTs processed on composite SopSiC substrate. Almost all tested devices present good device stability and promising performance. The reliability issues identified during the work are clearly related to the high levels of ga