Reliability analysis of two special three-state devices : J. L. Roca. Microelectron. Reliab. 24 (5) 899 (1984)

• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 130 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90568-8