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Reliability analysis of process-induced cracks in rotary swaged shell nose part

✍ Scribed by Jang, Jeong-hwan; Kwon, Won-hee; Chun, Se-hwan; Moon, Young-hoon


Book ID
113099850
Publisher
Springer-Verlag
Year
2012
Tongue
English
Weight
426 KB
Volume
26
Category
Article
ISSN
1738-494X

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