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Reliability analysis of photovoltaic modules

โœ Scribed by P. Longrigg


Publisher
Elsevier Science
Year
1989
Weight
645 KB
Volume
26
Category
Article
ISSN
0379-6787

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Degradation analysis of thin film photov
โœ C. Radue; E.E. van Dyk ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 174 KB

Five thin film photovoltaic modules were deployed outdoors under open circuit conditions after a thorough indoor evaluation. Two technology types were investigated: amorphous silicon (a-Si:H) and copper indium gallium diselenide (CIGS). Two 14 W a-Si:H modules, labelled Si-1 and Si-2, were investiga