Reliability analysis of intermittently used systems when failures are detected only during a usage period : T. Nakagawa and Y. Sawa and Y. Suzuki. Microelectron. and Reliab.15, 35 (1976)

• Publisher: Elsevier Science
• Year: 1976
• Tongue: English
• Weight: 117 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(76)90422-4