Reliability analysis of an mn system with inspections: C. Singh and M. D. Kankam. Microelectron. Reliab.16, 691 (1977)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 127 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90896-x