✦ LIBER ✦
Reliability analysis of a 2-out-of-n: F system with repairable primary and degradation units: Yasuhiro Yonehara, Masahiro Nakamura and Shunji Osaki. Microelectron. Reliab.22 (6), 1081 (1982)
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 129 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0026-2714
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