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Reliability Analysis and Optimal Redundancy for Majority-Voted Logic Circuits

✍ Scribed by Mine, Hisashi; Hatayama, Kazumi

Book ID: 117934392
Publisher: IEEE
Year: 1981
Tongue: English
Weight: 508 KB
Volume: R-30
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.1981.5221029

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