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Relaxation, self-trapping, and decay of electron excitations in wide-gap oxides

✍ Scribed by Ch. Lushchik; A. Lushchik; T. Kyarner; M. Kirm; S. Dolgov


Book ID
110543372
Publisher
Springer
Year
2000
Tongue
English
Weight
859 KB
Volume
43
Category
Article
ISSN
1573-9228

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