Relative intensities of different reflection order X-ray lines registered by microprobe analyzers

✍ Scribed by Yu.G. Lavrent'ev; V.N. Korolyuk; E.N. Nigmatulina; N.S. Karmanov

• Book ID: 112233358
• Publisher: John Wiley and Sons
• Year: 2012
• Tongue: English
• Weight: 152 KB
• Volume: 41
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/xrs.2408