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Relative coherency strain and phase transformation history in epitaxial ferroelectric thin films

✍ Scribed by Foster, C. M.; Pompe, W.; Daykin, A. C.; Speck, J. S.

Book ID: 120253759
Publisher: American Institute of Physics
Year: 1996
Tongue: English
Weight: 676 KB
Volume: 79
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.360978

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