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Relationship between root-mean-square and peak-to-peak jitter measurements

✍ Scribed by Dubravko Babić; John Plombon


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
131 KB
Volume
39
Category
Article
ISSN
0895-2477

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✦ Synopsis


Abstract

The statistical relationship between peak‐to‐peak and root‐mean‐square (RMS) measurements of random and deterministic jitter is discussed. An analytic expression relating the two quantities is derived for normally distributed random jitter. This work is applicable to a production test of electronic or optical components that uses sampling oscilloscopes for jitter characterization. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 39: 323–326, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11204


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