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Relationship between point defect clusters and the temperature dependence of yield stress in fatigued copper polycrystals

✍ Scribed by Victoria, J. ;González, R. ;Piqueras, J. ;Brú, L.


Publisher
John Wiley and Sons
Year
1977
Tongue
English
Weight
228 KB
Volume
43
Category
Article
ISSN
0031-8965

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Analysis of Point Defect States in Coppe
✍ D. E. Becker; F. Dworschak; H. Wollenberger 📂 Article 📅 1972 🏛 John Wiley and Sons 🌐 English ⚖ 434 KB

## Abstract The temperature dependence of the defect production has been investigated by irradiating high purity copper samples with 3 MeV electrons in the temperature range 50 to 207 K. From the initial damage rate the capture radius of the vacancy for migrating interstitials is derived. The obser