Relationship between intrinsic surface resistance and critical current density of YBCO thin films with various thickness

✍ Scribed by K. Nakagawa; S. Nakayama; A. Saito; S. Ono; H. Kai; M. Mukaida; T. Honma; S. Ohshima

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 452 KB
• Volume: 470
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/j.physc.2010.05.113

✦ Synopsis

We investigated the relationship between the intrinsic surface resistance (R int s ) and critical current density (J c ) of YBa 2 Cu 3 Oy (YBCO) film thinner than the penetration depth (k L ). The measured YBCO films were deposited on CeO 2 -buffered r-cut Al 2 O 3 substrates by the pulsed laser deposition method. The thicknesses of these films were 300, 200, and 100 nm, respectively. The R int s means the surface resistance of YBCO film removing the loss by the impedance of the substrates. The effective surface resistance (R eff s ) including the impedance of the substrate and the J c of each YBCO film were measured using the dielectric resonator method at 21.8 GHz and the inductive method. We calculated R int s by using phenomenological expressions and the R eff s value. The R int s values of each YBCO film were almost the same in the measured temperature region. As a result, we found that R int s was in inverse proportion to the J c of YBCO film thinner than k L .