𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Relationship between Electrical Activity and Grain Boundary Structural Configuration in Polycrystalline Silicon

✍ Scribed by Zhan-Jie Wang; Sadahiro Tsurekawa; Kenji Ikeda; Takashi Sekiguchi; Tadao Watanabe

Book ID
110267794
Publisher
Springer
Year
1999
Tongue
English
Weight
676 KB
Volume
7
Category
Article
ISSN
0927-7056

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Relationship between grain-boundary capa
Relationship between grain-boundary capacitance and bulk shallow donors in SnO2polycrystalline semiconductor
✍ Bueno, P. R. ;Santos, M. A. ;RamΓ­rez, M. A. ;Tararam, R. ;Longo, E. ;Varela, J. πŸ“‚ Article πŸ“… 2008 πŸ› John Wiley and Sons 🌐 English βš– 567 KB

## Abstract The relationship between grain‐boundary capacitance and extrinsic shallow donors caused by Nb addition to SnO~2~Β·CoO binary polycrystalline system has been investigated by means of combined techniques such as __I__ –__V__ characteristic response, complex impedance and capacitance analys