Relationship between design patterns defects and crosscutting concern scattering degree: an empirical study

✍ Scribed by Aversano, L.; Cerulo, L.; Di Penta, M.

• Book ID: 114445000
• Publisher: The Institution of Engineering and Technology
• Year: 2009
• Tongue: English
• Weight: 365 KB
• Volume: 3
• Category: Article
• ISSN: 1751-8806
• DOI: 10.1049/iet-sen.2008.0105