Relationship between 1/f noise parameter and Andreev reflection probability of epitaxial NbN/AlN or MgO/NbN tunnel junctions

✍ Scribed by H. Ishida; A. Kawakami; Z. Wang; K. Hamasaki

• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 304 KB
• Volume: 412-414
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/j.physc.2004.01.171