✦ LIBER ✦
Relation between yield and reliability of integrated circuits and application to failure rate assessment and reduction in the one digit FIT and PPM reliability ERA
✍ Scribed by Jacob A. Van Der Pol; Fred G. Kuper; Eric R. Ooms
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 628 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.