Relation Between the Mobility, Noise, and Channel Direction in MOSFETs Fabricated on (100) and (110) Silicon-Oriented Wafers

✍ Scribed by Gaubert, P.; Teramoto, A.; Weitao Cheng; Ohmi, T.

• Book ID: 114620002
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 667 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2047584