Relation between the adhesion strength and interfacial width for symmetric polystyrene bilayers
✍ Scribed by Kei-Ichi Akabori; Daisuke Baba; Kazuhiro Koguchi; Keiji Tanaka; Toshihiko Nagamura
- Book ID
- 105338490
- Publisher
- John Wiley and Sons
- Year
- 2006
- Tongue
- English
- Weight
- 251 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0887-6266
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✦ Synopsis
Abstract
Polystyrene (PS) bilayers were prepared and were adhered at a temperature between the surface and bulk glass‐transition temperatures for a given time. Then, the interfacial adhesion strength (G~L~) was examined with a conventional lap‐shear measurement. G~L~ first increased with increasing adhesion time and then reached a constant value. This result implied that the segments moved across the interface, to a certain depth, even at a temperature below the bulk glass‐transition temperature. To confirm this, the interfacial evolution for the PS/deuterated PS bilayers was examined with dynamic secondary‐ion mass spectrometry. The G~L~ value was linearly proportional to the thickness of the interfacial adhesion layer. Finally, we propose a strategy for regulating the adhesion strength based on the chain‐end chemistry. © 2006 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 44: 3598–3604, 2006