✦ LIBER ✦
Relation between low-frequency noise and long-term reliability of single AlGaAs/GaAs power HBTs
✍ Scribed by Mohammadi, S.; Pavlidis, D.; Bayraktaroglu, B.
- Book ID
- 114538078
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 215 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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