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Relation between electrical conductivity and structural characteristics in boron-doped LPCVD polycrystalline silicon used in sensor devices

✍ Scribed by S. Marco; O. Ruiz; J. Samitier; J.R. Morante; J. Bausells


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
907 KB
Volume
37-38
Category
Article
ISSN
0924-4247

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