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Refractometry through optical frequency-domain reflectometry

✍ Scribed by Tjhung, T.T.; Teo, S.K.; Mendis, F.V.C.; Selvan, B.


Book ID
111899594
Publisher
The Institution of Electrical Engineers
Year
1985
Tongue
English
Weight
276 KB
Volume
21
Category
Article
ISSN
0013-5194

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