Refractive index profile measurement techniques by reflectivity profiling: vidicon imaging, beam scanning, and sample scanning

✍ Scribed by Steffen, Jochen ;Neyer, Andreas ;Voges, Edgar ;Hecking, Norbert

• Book ID: 115341145
• Publisher: The Optical Society
• Year: 1990
• Tongue: English
• Weight: 592 KB
• Volume: 29
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.29.004468