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Refractive index dispersion of light-guiding thin films by a spectroscopically extended dark m-lines method: application to Garnet and amorphous hydrogenated silicon layers

✍ Scribed by M. Olivier; J.S. Danel; J.C. Peuzin; D. Challeton; P. Bouchut


Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
105 KB
Volume
89
Category
Article
ISSN
0040-6090

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