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Refractive index at infrared wavelengths and dielectric permittivity of pure and fluorinated silicon dioxide from measurements of their thin films deposited on Si

✍ Scribed by Power, G; Vij, J K; Shaw, M


Book ID
120195805
Publisher
Institute of Physics
Year
2004
Tongue
English
Weight
189 KB
Volume
37
Category
Article
ISSN
0022-3727

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