A simple reflection-type two-dimensional
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Youngchun Youk; Dug Young Kim
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Article
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2006
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Elsevier Science
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English
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We report a new configuration of a reflection-type confocal scanning optical microscope system for measuring the refractive index profile of an optical waveguide. Several improvements on the earlier design are proposed; a light emitting diode at 650 nm wavelength instead of a laser diode or He-Ne la