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Reflectivity and diffraction study of Co/Cu multilayer using synchrotron X-rays

✍ Scribed by C.C. Tang; E.J. MacLean; N.D. Telling


Book ID
114229751
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
76 KB
Volume
198-199
Category
Article
ISSN
0304-8853

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