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Reflectionz-scan for measuring the nonlinear refractive index of porous silicon

✍ Scribed by Mei Xiang; Zhen-hong Jia; Xiao-yi Lv


Book ID
107509691
Publisher
Tianjin University of Technology
Year
2010
Tongue
English
Weight
227 KB
Volume
6
Category
Article
ISSN
1673-1905

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