Reflection Splitting in RHEED Investigations of Vacuum Evaporated GaAs Layers

✍ Scribed by H. Hottmann; Dozent Dr. M. Schulz

• Publisher: John Wiley and Sons
• Year: 1974
• Tongue: English
• Weight: 652 KB
• Volume: 9
• Category: Article
• ISSN: 0232-1300
• DOI: 10.1002/crat.19740090610

✦ Synopsis

Abstract

RHEED‐diagrams of vacuum deposited GaAs‐films with high density of structural defects often show splitting of matrix reflections into satellites. It can be shown by simple models, for example of {111}‐oriented films, that this phenomenon is originated by formation of stacking faults perpendicular to 〈ĪĪĪ〉‐B growth directions of the films. The conditions for 〈110〉 and 〈211〉 azimuths are discussed.