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Reflection electron microscopy study of clean Si(111) surface reconstruction during the (7 × 7) ⇔ (1 × 1) phase transition

✍ Scribed by A.V. Latyshev; A.B. Krasilnikov; A.L. Aseev; L.V. Sokolov; S.I. Stenin

Publisher: Elsevier Science
Year: 1991
Weight: 68 KB
Volume: 254
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(91)90026-n

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