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Reflection electron-energy-loss spectroscopy of FexSi1 −xthin films

✍ Scribed by A. S. Parshin; G. A. Alexandrova; A. E. Dolbak; O. P. Pchelyakov; B. Z. Ol’shanetskiĭ; S. G. Ovchinnikov; S. A. Kushchenkov

No coin nor oath required. For personal study only.

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