✦ LIBER ✦
Reflection-diffraction x-ray diffraction depth profiling of reactively sputtered highly oriented TiN on MgO
✍ Scribed by C.S. Helrich; R.C. Buschert; A.J. Kropf; C. Ernberger; T. Smith
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 475 KB
- Volume
- 39-40
- Category
- Article
- ISSN
- 0257-8972
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