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Reflectance spectroscopy (UV-Vis-NIR, FTIR) of oxide films. Oxide layers on copper and nickel

✍ Scribed by M. Lenglet; J. M. Machefert; J. Arsene; P. Leterrible; J. M. Welter; M. Lecalvar; R. Fontaine


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
228 KB
Volume
12
Category
Article
ISSN
0142-2421

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