✦ LIBER ✦

Reflectance of silicon surfaces after high dose rate molecular ion implantation

✍ Scribed by M.O. Lampert; M. Hage-Ali; J.C. Muller; M. Toulemonde; P. Siffert

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Oxide rate characterization of high dose

✍ Mikołaj Kisielewicz 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 567 KB

Volume changes of silicon thin surface l

✍ J. Grňo; Š. Bederka; M. Veselý; P. Mates 📂 Article 📅 1984 🏛 Elsevier Science 🌐 English ⚖ 274 KB

The formation of SiO2 films on silicon b

✍ U. Kreissig; E. Hensel; W. Skorupa; H. Johansen 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 398 KB

Residual disorder in silicon after annea

✍ D. Hagmann 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 370 KB

Surface characterization of ultrahigh mo

✍ A. Tóth; I. Bertóti; E. Szilágyi; H. Dong; T. Bell; A. Juhász; P. M. Nagy 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 93 KB 👁 2 views

The formation of buried Si3N4 layers in

✍ U. Kreissig; W. Skorupa; E. Hensel 📂 Article 📅 1983 🏛 Elsevier Science 🌐 English ⚖ 177 KB