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Reflectance and total photoelectric yield measurements of silicon wafers in the XUV spectral range

✍ Scribed by Bartsch, F -R; Birken, H -G; Kunz, C; Wolf, R

Book ID: 111657763
Publisher: Institute of Physics
Year: 1990
Tongue: English
Weight: 549 KB
Volume: 5
Category: Article
ISSN: 0268-1242
DOI: 10.1088/0268-1242/5/9/008

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